Latest memory test Weblinks:
- Memory device and method for testing memory devices with repairable redundancy
A memory device and method for testing memory devices with repairable redundancy is disclosed. In one embodiment, both the regular memory area and the redundant memory area are subject to the same loads during manufacturing and test processes, and that at least one regular memory cell from a regular memory...- Semiconductor integrated circuit having test function and manufacturing method
The logic integrated circuit comprises a logic circuit having the predetermined logic functions, a read/write memory circuit, a test circuit for testing whether fail bit is included in the memory circuit or not, and a boundary latch circuit formed of a plurality of flip-flop circuits which are capable of latching...Final results- Test pattern generator and test pattern generation method for onboard memory devices
A test pattern generator generating a test pattern for performance testing of an onboard memory is provided for a device having a memory macro, a serial input interface, and a latch circuit latching the serial input signal and outputting the result to the memory macro in parallel format. This test...- Compilable memory structure and test methodology for both asic and foundry test environments
A memory structure configured for supporting multiple test methodologies includes a first plurality of multiplexers configured for selectively coupling at least one data input path and at least one address path between an external customer connection and a corresponding internal memory connection associated therewith. A second multiplexer is configured for...- ABC News Radio - National Memory Test
Final results- Semiconductor memory device in which memory cells are tested using several different test data patterns and method thereof
There is provided a memory device in which memory cells may be tested using several different test data patterns. The memory device may include a switch unit, a plurality of storage units, and a selector. The switch unit may transfer bits of data received in response to a mode control...
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