Latest 86 memory test Weblinks:
- $63.83 (Used $86.88) SanDisk SDSDH-2048-901 2 GB Ultra II Secure Digital Memory Card, Retail Package)
$63.83 (Used $86.88) SanDisk SDSDH-2048-901 2 GB Ultra II Secure Digital Memory Card, Retail Package)- perl-Test-Memory-Cycle - 1.04-1.fc6.noarch
perl-Test-Memory-Cycle - Check for memory leaks and circular memory references Perl's garbage collection has one big problem: Circular references can't get cleaned up. A circular reference can be as simple as two objects that refer to each other. "Test::Memory::Cycle" is built on top of "Devel::Cycle" to give you an easy way to check for these circular references. Change Log: Wed, 09 Aug 2006 GMT - Jose Pedro Oliveira - 1.04-1 - Update to 1.04. Mon, 20 Feb 2006 GMT - Jose Pedro Oliveira - 1.02-2 - Rebuild for FC5 (perl 5.8.8). Tue, 24 May 2005 GMT - Jose Pedro Oliveira - 1.02-1 - Update to 1.02. ...- $57.95 (Used $86.88) Sandisk SDSDH-2048-901 2 GB Ultra II Secure Digital Memory Card
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$56.90 (Used $86.88) SanDisk SDMSV-2048-A10 2.0 GB Memory Stick Pro, Retail Package)- Abist data compression and serialization for memory built-in self test of sram with redundancy
A method and apparatus for implementing ABIST data compression and serialization for memory built-in self test of SRAM with redundancy. The method includes providing detection signals asserted for one failing data out, two failing data outs, and greater than two failing data outs. The method also includes individually encoding the...- $47.98 (Used $86.88) SanDisk SDSDH-2048-901 2 GB Ultra II Secure Digital Memory Card, Retail Package)
$47.98 (Used $86.88) SanDisk SDSDH-2048-901 2 GB Ultra II Secure Digital Memory Card, Retail Package)- $65.95 (Used $86.88) SanDisk SDSDH-2048-901 2 GB Ultra II Secure Digital Memory Card, Retail Package)
$65.95 (Used $86.88) SanDisk SDSDH-2048-901 2 GB Ultra II Secure Digital Memory Card, Retail Package)- Method and apparatus for providing flexible modular redundancy allocation for memory built in self test of sram with redundancy
A method and apparatus for providing flexible modular redundancy allocation for memory built in self test of random access memory with redundancy. The apparatus includes a first redundancy support register that includes inputs for receiving an address of a location in memory under test and data relating to must fix...
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